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Photonics Buyers' Guide / Nanotechnology Imaging Systems / Bruker Nano Surfaces, Div. of Bruker Corp.
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Map3400 E Britannia Dr.
Suite 150
Tucson, AZ 85706
United States
Phone: +1 520-741-1044
Fax: +1 520-294-1799

High-Resolution Chemical Imaging with Tapping AFM-IR

Author: Anirban Roy, PhD (Bruker nanoIR Applications Scientist) and Dean Dawson (Bruker nanoIR Spectroscopy Business Manager) Monday, April 01, 2019
Where the spatial resolution of conventional bulk IR spectroscopy is limited by diffraction to ~3-10 ┬Ám, atomic force microscopy (AFM) provides a nanoscale topographic map of a sample surface. However, AFM has been unable traditionally to chemically characterize materials. This article discusses Tapping AFM-IR, which is a photothermal technique that combines AFM and IR spectroscopy to unambiguously identify the chemical composition of a sample with tens-of-nanometers spatial resolution.

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File: High_Resolution_Chemical_Imaging2.pdf (479.27 KB)
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