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Edinburgh Instruments Ltd.
A Techcomp Instruments Europe Co.

1 Bain Square
Kirkton Campus
Livingston EH54 7DQ
United Kingdom

Phone: +44 1506 425300

Fax: +44 1506 425320

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Characterisation of SERRS Nanoparticles Using UV-Vis and Raman Spectroscopy

Wednesday, February 15, 2023
Surface-enhanced resonance Raman scattering (SERRS) is a technique that offers unparalleled sensitivity and specificity in spectroscopic detection and is promising for many applications in analytical research. In this new Application Note, we use the DS5 UV-Vis Dual Beam Spectrophotometer and RM5 Raman Microscope to demonstrate that the optical response of SERRS nanosensors contains combined SERS and RRS effects.

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File: Nanoparticles_Edinburgh_Instruments.pdf (1.32 MB)
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