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IDS Imaging Development Systems GmbH
MapDimbacher Str. 10
74182 Obersulm
Germany
Phone: +49 7134 96196 0

Pregius S: IDS Sets New Standards

Pregius S: IDS sets new standardsIDS integrates the high-performance, extremely high-resolution sensor IMX541 from the Pregius S series into the versatile uEye SE camera family. Thanks to its compact 1.1" format, the 20.35 MP CMOS sensor is compatible with C-mount lenses. The industrial cameras feature a practical USB3 Vision interface, deliver 20 fps and will be available from September either as board-level models or with a robust metal housing.

Pregius S — the fourth generation of extremely powerful CMOS image sensors from Sony — makes BSI ("Back Side Illuminated") technology available for the first time in global shutter sensors. The benefits are smaller pixels (only 2.74 μm, which allows a significantly higher pixel density), higher resolution and also improved quantum efficiency and sensitivity. The new camera models deliver outstanding image quality that leaves nothing to be desired even in demanding machine vision applications such as surface inspections, detailed image evaluation in medical technology or use in the traffic sector. Anyone who values high-resolution images — for example to detect even the smallest material defects — will hardly be able to overlook these sensors in the future.

The compact industrial cameras are therefore also a sensible alternative to cameras with similar high-resolution, but large-format sensors, for which F-mount lenses are usually required. With the uEye SE models, C-mount lenses can be used — which means considerable cost savings. Thanks to the USB3 Vision interface, the cameras are also uncompromisingly Vision Standards-compliant and can therefore be used comfortably with IDS peak, for example. The free SDK is characterized by an easy-to-use programming interface developed by IDS. Users no longer need to work directly with GenTL and GenAPI. Convenience classes help to reduce programming effort and thus minimize potential sources of error.

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