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Photonics Buyers' Guide / Instrument Systems GmbH, Member of the Konica Minolta Group
Instrument Systems

Instrument Systems GmbH
Member of the Konica Minolta Group

MapKastenbauerstr. 2
81677 Munich
Phone: +49 89 454943 0
Fax: +49 89 454943 11
With the development of high-end light measurement solutions, Instrument Systems supports their customers’ innovative and safe products. Market leaders in the automotive and aviation industry, the lighting industry and consumer electronics place their trust in our measuring systems for the qualification of lighting components and displays. High-precision spectrometers, (spectrally corrected) imaging colorimeters, photometers, and goniometers are our main products, operated by user-friendly software solutions for production, QC and R&D labs. The new VCSEL testing portfolio by Instrument Systems covers single shot spatial measurements in the near and far field; spectral VCSEL characteristics plus total power for down to one nanosecond pulses of the thermally stabilized DUT.

Instrument Systems can share an unrivalled specialist knowledge over an extremely broad range of applications. As a successful medium-sized technology enterprise, we have been a member of the Konica-Minolta Group since 2012. Assisted by our representatives with many years of experience, we use the group’s international network to offer our customers optimum support and reliable global service.

We bring quality to light.
Established: 1986
Employees: 250
Ownership type: Publicly Traded Stock
Markus Ehbrecht, CEO & Managing Director
Tsutomu Ogasawara, Managing Director
Christoph Kappel, VP R&D


LumiTop X20 - Soon to come! - Instrument Systems GmbH
sensors & detectorslasersdisplay measurementSSL measurementlight measurementspectroradiometerimaging photometers and colorimetergoniophotometerGoniometerautomobile lighting measurementPhotometersintegrating spheresLED testingDisplay testingwafer testingspectrometer CAS 140Dimaging photometer and colorimeter LumiCam 2400LumiTop 4000Goniometer LGS 1000stray light correctionSpectroradiometryPhotometry
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