Full company details
M3 Measurement Solutions Inc.
8906 Nelson Way
Escondido, CA 92026
United States
SPIE Photonics West 2017 Booth: 5536
XPLOR 100 3D Inspection Station
Photonics.com
Jan 2017The XPLOR 100 is a fully automated metrology device designed for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands (works for most IR glasses).
This instrument enables full quality assurance and reports to guarantee your incoming and outgoing material meets specifications. XYZ resolution of +/- 1um. Sample size up to 100mm × 100mm × 100mm.
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