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MAD CITY LABS INC.
Map2524 Todd Dr.
Madison, WI 53713
United States
Phone: +1 608-298-0855
Fax: +1 608-298-9525

Atomic Force Microscopy Enhances the Nanoscopy Toolkit

Author: James F. MacKay Friday, March 5, 2021
Imaging and morphology represent a critical puzzle piece when trying to understand nanoscale structures, whether they are naturally occurring, such as viruses, or engineered structures, such as nano-antennas and photonic devices. In addition to imaging, atomic force microscopy (AFM) is ideal for nanomechanical characterization, bringing utility to nanoscopy applications and excelling in conditions where low light presents challenges or sample integrity is vital.

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