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Borsigstr. 78
D-52525 Heinsberg
Phone: +49 2452 96001 10
Thin-film metrology. Optical inline and off-line measurement systems for industries including optical media, FPD, photovoltaic, and OLED lighting. Spectrometric thin-film measurement technology for thickness measurement and optical constants of thin films. Thickness range from 5 nm to 1.5 mm.

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