Polytec Inc.
Sub. of Polytec GmbH

  

The Polytec TopMap Micro.View and Micro.View+ are the next generation optical surface profilers. Coherence scanning interferometry is an unambiguous technique to quantify parameters such as texture, flatness, ripple and roughness on a wide range of reflectivities and finishes, intricate microstructures and MEMS. More info


Additionally the TopMap portfolio includes the Pro.Surf, Pro.Surf+ and Metro.Lab large field of view systems. These unique 3D optical profilers are ideal for flatness, macroroughness, waviness, step-height and more. With a field of view of 45mm x 35mm and 70mm of working distance these products utilize telecentric optical design allow for measurement of recessed surfaces without clipping of edges. The Pro.Surf+ combines coherence scanning interferometry with a confocal probe as a first of its kind multi-sensor technology for both flatness and roughness evaluation. More info



Surface topography and dynamic motion analysis and visualization are key to testing and developing microstructures such as MEMS devices (Micro-Electro-Mechanical Systems). They are indispensable for validating FE calculations, determining cross-talk effects and measuring surface deformation.

The MSA-600 Micro System Analyzer is the all-in-one optical measurement workstation for characterizing surface topography as well as in-plane and out-of-plane motions. This instrument delivers increased measurement flexibility and precision, adapting to the needs of today’s and tomorrow’s microstructures. The Micro System Analyzer provides precise 3D dynamic and static response data that increases device performance while reducing development and manufacturing costs. Thus, it enhances and shortens design cycles, simplifies trouble shooting and improves yield. More info