Search
Menu
Photonics ProductsMicroscopyMicroscope SystemsScanning Probe

Dimension FastScan

  • Model: Dimension FastScan
  • Company: Bruker Nano Surfaces
  • Type: Scanning Probe
  • Applications: Medical/Clinical Science, Life Science, Industrial, Material Science
  • X-Y Scan Range: 90 μm × 90 μm typical
  • Z Range: 10 μm typical in imaging
  • Integral Nonlinearity XYZ: <0.50%

The Dimension FastScanTM atomic force microscope (AFM) delivers, for the first time, extreme imaging speed without sacrificing resolution and performance. This enables radically fast time to publishable data for all levels of AFM expertise.
Dimension FastScan

Bruker Nano Surfaces
5255 E Williams Circle, Suite 2080
Tucson, AZ 85711
United States
Phone: +1 520-741-1044
Fax: +1 520-294-1799
Toll-free: +1 800-873-9750
Twitter LinkedIn
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.