Dimension FastScan
< Back to Catalog
Phone: +1 520-741-1044
Fax: +1 520-294-1799
- Type: Scanning Probe
- Applications: Medical/Clinical Science, Life Science, Industrial, Material Science
- X-Y Scan Range: 90 μm × 90 μm typical
- Z Range: 10 μm typical in imaging
- Integral Nonlinearity XYZ: <0.50%
The Dimension FastScanTM atomic force microscope (AFM) delivers, for the first time, extreme imaging speed without sacrificing resolution and performance. This enables radically fast time to publishable data for all levels of AFM expertise.
Request Info About This Product
* Country:
When you click "Send Request", we will record and send your personal contact information to Bruker Nano Surfaces by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register