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Dimension FastScan

  • Model: Dimension FastScan
  • Company: Bruker Nano Surfaces
  • Type: Scanning Probe
  • Applications: Medical/Clinical Science, Life Science, Industrial, Material Science
  • X-Y Scan Range: 90 μm × 90 μm typical
  • Z Range: 10 μm typical in imaging
  • Integral Nonlinearity XYZ: <0.50%

The Dimension FastScanTM atomic force microscope (AFM) delivers, for the first time, extreme imaging speed without sacrificing resolution and performance. This enables radically fast time to publishable data for all levels of AFM expertise.
Dimension FastScan

Bruker Nano Surfaces
3400 E Britannia Dr.
Suite 150
Tucson, AZ 85706
United States
Phone: +1 520-741-1044
Fax: +1 520-294-1799
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