VCSEL Wafer Package Tester VMSF3000

VMSF3000 performs optical and electrical characterization of VCSEL chips and VCSEL package devices. The machine measures IL, wavelength, polarization, and FFP. This machine completes optical inspection on the top side of the chip, sort package into different trays, conduct aging for degradation and utilize a golden sample for calibration. Measurement is conducted at controlled temperatures and all data recorded and stored in a file for easy review and analysis.