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Photonics ProdSpec

X-ray Resolution Test Chart XRESO-20

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NTT Advanced Technology Corporation
Muza Kawasaki Central Tower
1310 Omiya-cho, Saiwai-ku
Kawasaki, Kanagawa 212-0014
Japan

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Phone: +1 408-474-0214
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NTT Advanced Technology Corporation

X-ray Resolution Test Chart XRESO-20
  • Type: Other
  • Applications: Industrial, Scientific Research
  • Resolution: 20 nm
  • Absorber Material: ta
  • Absorber Thickness: 100 nm
  • Support Film: SiC base membrane
  • Chip Size: 10 mm × 10 mm
  • Flame Material: Si
  • Data Sheet

XRESO-100: 100 nm resolution, 1,000 nm thick Ta absoreber
XRESO-50HC: 50 nm resolution, 500 nm thick Ta absorber
X-ray Resolution Test Chart XRESO-20
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