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Teledyne DALSA - Z-Trak 2 LB

XLNCE SMX-BEN XRF Analyzer


An XRF metrology tool that provides non-destructive analysis for composition and coating thickness measurement of single and multi-layered materials up to 30 elements, ranging from less than a nanometer to microns, quickly and accurately on virtually any substrate.
XLNCE SMX-BEN XRF Analyzer

EDAX Inc., Materials Analysis Div.
91 McKee Dr.
Mahwah, NJ 07430
United States
Phone: +1 201-529-4880
Fax: +1 201-529-3156
Toll-free: +1 800-535-3329
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