F20 Thin-Film Measurement System
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Phone: +1 858-573-9300
Fax: +1 858-573-9400
- Type: Benchtop
- Measurement Techniques: Absorption, Reflectance and Transmission, Other
- Spectral Range (nm): 190 - 1690
- Applications: Biomedical/Medical, Defense, Environmental Monitoring, Materials Identification, Scientific Research, Semiconductor, Other
- Thickness Range: 1 nm - 450 um
- Thickness Accuracy: As little as 1 nm or 0.2%
Tabletop thin-film measurement system. Measure the thickness and refractive index of just about any dielectric or semiconductor film, even multiple films in the same stack simultaneously. Models are available that cover wavelengths from 190 to 2200nm.
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