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aRTie Thin-Film Measurement System

  • Model: aRTie Thin-Film Measurement System
  • Company: Filmetrics, KLA Instruments
  • Type: Benchtop
  • Measurement Techniques: Absorption, Reflectance and Transmission, Other
  • Spectral Range (nm): 380 - 1050
  • Applications: Biomedical/Medical, Defense, Environmental Monitoring, Materials Identification, Scientific Research, Semiconductor, Other
  • Thickness Range: 15nm - 70┬Ám
  • Thickness Accuracy: Greater of 0.2% or 2 nm

Measure film thickness and more. Options included simultaneous transmittance measurement and refractive index measurement. On-board reflectance and wavelength calibration are standard. This version is USB-powered and has an internal 40k-hr light source. A UV version covering wavelengths of 190-1100nm is also available.

Filmetrics, KLA Instruments
10655 Roselle St.
San Diego, CA 92121
United States
Phone: +1 858-573-9300
Fax: +1 858-573-9400
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