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X-ray Resolution Test Chart XRESO-20

  • Model: X-ray Resolution Test Chart XRESO-20
  • Company: NTT Advanced Technology Corporation
  • Type: Other
  • Applications: Industrial, Scientific Research
  • Resolution: 20 nm
  • Absorber Material: ta
  • Absorber Thickness: 100 nm
  • Support Film: SiC base membrane
  • Chip Size: 10 mm × 10 mm
  • Flame Material: Si

XRESO-100: 100 nm resolution, 1,000 nm thick Ta absoreber
XRESO-50HC: 50 nm resolution, 500 nm thick Ta absorber
X-ray Resolution Test Chart XRESO-20

NTT Advanced Technology Corporation
Tokyo Opera City Tower
3-20-2, Nishi-shinjuku
Shinjuku, Tokyo 163-1436
Japan
Phone: +1 408-474-0214
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