Near-Infrared Intensity Lens

Name: Near-Infrared Intensity Lens
Brand: Radiant Vision Systems, Test & Measurement

The Near-Infrared (NIR) Intensity Lens solution from Radiant Vision Systems is a compact camera/lens system capable of capturing the full angular distribution of a NIR-emitting light source in a single image. Compared to goniometric solutions for light source characterization, the NIR Intensity Lens captures complete angular emission data without moving parts. Ideal for evaluating NIR light sources used in facial recognition applications (near-infrared lasers or LEDs), the system is designed to measure wavelengths from 930-950 nanometers and includes software capable of identifying and evaluating the dot patterns created by any diffractive optical element (DOE). Regardless of the DOE dot pattern, position, shape, or size, the NIR Intensity Lens solution automatically identifies each dot and outputs data for each dot’s angle of location (azimuth, inclination), maximum intensity, uniformity, and flux.

Near-infrared light is ideal for facial recognition because it is invisible to the human eye, making it unnoticeable when cast onto a user’s face. However, because they are not perceived by human vision, measuring emissions from NIR light sources is critical for safe (in accordance with standards such as IEC60825-1) and accurate 3D sensing performed by NIR-based face ID devices. In facial recognition, emissions from NIR LEDs and lasers may be distributed in patterns using DOE to enable sensing of three-dimensional features.

In devices using DOE technology, diffracted light casts an array of tiny invisible dots across the user’s face, creating a 3D map. Each dot must be accurately positioned (correct angle, inclination, azimuth) and emitted with the correct radiant intensity (W/sr) to ensure it is properly reflected back and “understood” by the device’s infrared sensor. Radiant’s NIR Intensity Lens is capable of both flood distribution measurement (analyzing uniformity, hot spots, fall off, and other aspects of the source) as well as dot statistic measurement for DOEs.

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