Photonics SuppliersScanning Electron Microscopes (SEM)

Raith America Inc.

Map1377 Long Island Motor Pkwy.
Suite 101
Islandia, NY 11749
United States
Phone: +1 631-738-9500
Fax: +1 631-738-2055
Offers electron beam lithography (EBL), focused ion beam (FIB), and scanning electron microscope (SEM) instruments for research and development and compound semiconductor production. Also offers nanolithography attachment kits for SEMs, FIBs, FIB-SEMs, and helium/neon ion microscopes.
Established: 1985
Ownership type: Privately Owned
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.