14 suppliers

Scanning Probe Microscopes

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Designs and manufactures piezo nanopositioning systems and nanoscale precision instruments for metrology, photonics, astronomy, and microscopy. Closed loop nanopositioners with low noise, high stability PicoQ sensors. Products include piezo nanopositioners, single molecule microscopes, high precision micropositioning, AFM, and custom design.

Bruker Nano Surfaces - Tucson, AZ

Extensive suite of application-focused instrumentation for life sciences and materials research and production covers the full range of metrology techniques, sample sizes, and imaging resolutions. Technologies include AFMs, NanoIR spectrometers, fluorescence microscopes, stylus and optical profilers, mechanical testers, and nano-indenters.

Advanced Surface Microscopy Inc. - Indianapolis, IN

Bruker Nano GmbH, JPK BioAFM - Berlin, Germany

FormFactor - Bergisch Gladbach, Germany

K-Tek Nanotechnology LLC - Wilsonville, OR

Molecular Vista Inc. - San Jose, CA

NanoMagnetics Instruments Ltd., Microscopy - Oxford, United Kingdom

NanoMagnetics Instruments USA - Easton, PA

Nanonics Imaging Ltd. - Jerusalem, Israel

Oxford Instruments Asylum Research - Santa Barbara, CA

Park Systems Corp. - Suwon, South Korea

Quantum Design Inc. - San Diego, CA

WITec GmbH - Ulm, Germany

Glossary

scanning probe microscope See atomic force microscope; magnetic force microscope; near-field scanning optical microscope; scanning tunneling microscope.
atomic force microscope An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few...
magnetic force microscope A variation of the atomic force microscope that operates by scanning a tiny ferromagnetic probe (or a magnetized tip) over a magnetic sample, and detecting the extremely small forces exerted on the probe by the sample's stray magnetic fields. The...
near-field scanning optical microscope A scanning probe microscope that analyzes the surface of a specimen by recording the intensity of light as it is focused through a pipette and raster scanned across the specimen at a distance less than a wavelength. The resolution and high contrast...

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