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Photonics Buyers' Guide / Test & Measurement / Scanning Tunneling Microscopes
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Scanning Tunneling Microscopes

A scanning tunneling microscope is a high-resolution imaging instrument that can detect and measure the positions of individual atoms on the surface of a material. A very fine conductive probe is placed above the surface of a conductive sample, and a bias voltage is applied between probe and surface, creating overlapping electron clouds and electrons that tunnel between the potential barrier between the probe and the sample. The probe tip is maintained at a constant distance from the sample, yielding a three-dimensional topographical image.


The Photonics Buyers' Guide is a comprehensive resource for verified providers of Scanning Tunneling Microscopes. Profiles and contact information for manufacturers and suppliers are provided by the companies and verified by our editors. If you have updated information about any of the organizations listed, please contact us.
Glossary
  • scanning tunneling microscope (STM) A high-resolution imaging instrument that can detect and measure the positions of individual atoms on the surface of a material. A very fine conductive probe is placed at a distance of 10 to 20 Å above the surface of a conductive sample, and a bias...
scanning probeSTMimaging instrumentdetectmeasureatoms on surfaceconductive probebias voltageoverlapping electron cloudselectronspiezoelectric transducer3-D topographical imagetopo imageramanmicro scopemicroscopytest & measurement
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