Search
Menu
Photonics SuppliersSoftware & ServicesOptical Design Software

Scientific Computing International

Map6355 Corte Del Abeto, Ste. C105
Carlsbad, CA 92011
United States
Phone: +1 760-634-3822
Fax: +1 760-634-3826
Provides metrology tools for thin-film characterization, material analysis, spectroscopic ellipsometry, and optical thin-film design. Products include a tool that simultaneously and unambiguously measures thickness, index, critical dimensions, surface roughness, composition, crystallinity, and optical constants of multilayer structures.
Established: 1993
Employees: 10
Facility area (sq ft): 8000
Ownership type: Privately Owned
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.