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Scanning Tunneling Microscopes

A scanning tunneling microscope is a high-resolution imaging instrument that can detect and measure the positions of individual atoms on the surface of a material. A very fine conductive probe is placed above the surface of a conductive sample, and a bias voltage is applied between probe and surface, creating overlapping electron clouds and electrons that tunnel between the potential barrier between the probe and the sample. The probe tip is maintained at a constant distance from the sample, yielding a three-dimensional topographical image.

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Bruker Nano Surfaces
Bruker Nano Surfaces - Tucson, AZ
Extensive suite of application-focused instrumentation for life sciences and materials research and production covers the full range of metrology techniques, sample sizes, and imaging resolutions. Technologies include AFMs, NanoIR spectrometers, fluorescence microscopes, stylus and optical profilers, mechanical testers, and nano-indenters.
Supplier/Distributor
Advanced Surface Microscopy Inc. - Indianapolis, IN
Circuit Insights LLC - Pasadena, CA
Molecular Vista Inc. - San Jose, CA
Oxford Instruments Asylum Research - Santa Barbara, CA
Glossary
  • scanning tunneling microscope A high-resolution imaging instrument that can detect and measure the positions of individual atoms on the surface of a material. A very fine conductive probe is placed at a distance of 10 to 20 Å above the surface of a conductive sample, and a...
Scanning Tunneling Microscopes Suppliersscanning probeSTMimaging instrumentdetectmeasureatoms on surfaceconductive probebias voltageoverlapping electron cloudselectronspiezoelectric transducer3-D topographical imagetopo imageramanmicro scopemicroscopytest & measurement

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