Phone: +49 2452 96001 10
Fax: +49 2452 64433
Thin-film metrology. Optical inline and off-line measurement systems for industries including optical media (CD, DVD, BD), flat panel display, photovoltaic, and OLED lighting. Spectromectric thin-film measurement technology for thickness measurement and optical constants of thin films. Thickness range from 5 nm to 1.5 mm.
Facility area (sq. ft): 10,000
Ownership type: Privately Owned
AUDIODEV GMBH PRODUCT AND SERVICE CATEGORIES
MS=Manufacture Stock | MC=Manufacture Custom | S=Supply/Distribute | D=Design