Thin-film metrology. Optical inline and off-line measurement systems for industries including optical media, FPD, photovoltaic, and OLED lighting. Spectrometric thin-film measurement technology for thickness measurement and optical constants of thin films. Thickness range from 5 nm to 1.5 mm.
This listing has not been verified by the company. If you know of a change to this information, please
email our editors.