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Raman Imaging and Scanning Electron Microscopy Solution

Photonics.com
Sep 2017ULM, Germany, Sept. 15, 2017 — WiTec GmbH’s Raman Imaging and Scanning Electron Microscopy Solution (RISE) is now available for the ZEISS Sigma 300 field- emission scanning electron microscope.

WITec and ZEISS are providing a fully integrated instrument available as an OEM product through ZEISS that features a standard, unmodified vacuum chamber and scanning electron microscope column along with a complete confocal Raman microscope and spectrometer. It expands the range of choices available to the researcher and incorporates generations of experience in Raman spectroscopic imaging and advanced structural analysis. WITec’s modular Raman technology allows 3D chemical characterization by combining a high-resolution confocal microscope with a high-throughput Raman spectrometer.

The research-grade optical microscope capability helps researchers survey their sample and quickly locate areas of interest. Both the objective and sample stage required for Raman microscopy are placed within the SEM’s vacuum chamber and can therefore remain under vacuum for all measurements; the sample is simply transferred between the Raman and scanning electron microscope measuring positions using the stage of ZEISS Sigma 300.More products