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Zurich Instruments AG - Lock-In Amplifiers 4/24 LB
Photonics Dictionary

reflection x-ray microscopy

A means of high resolution study through the application of soft and hard x-rays onto a sample surface in order to obtain image information from 1-10 nm layers and surfaces. The x-ray source emission is expanded and focused onto the sample whereby reflected light is re-imaged onto a detector surface.
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