CIM 2021: 20th Interntional Metrology Congress

The International Metrology Congress is a showcase for industrial applications, advances in R&D and prospects dedicated to measurements, analysis and testing processes.

Congress topic:
Controlled Measurements
uncertainties, traceability, cost optimization, certification, standardization, conformity and risks ... for measurement, analysis and testing processes

Optimized Measurements
techniques and best practices for mass, force, flow, pressure, dimension, electricity, time-frequency, temperature, hygrometry, optics and photonics, ionizing radiation, chemical measures, biological measures

Advanced Measurements
new technologies, smart sensors, Industrial IoT, data qualification, analysis and security, quantum technology, AI, blockchain, jobs evolution, recruitment

With applications to all sectors: mechanics, chemistry, pharmaceuticals, health, agro-food, environment, pollution, energy...