SPIE Optical Metrology 2015
June 22, 2015 - June 25, 2015MUNICH
SPIE
(360) 676-3290
About this Event
Scientists, engineers and researchers are encouraged to present their work at SPIE Optical Metrology 2015. The conference Optical Methods for Inspection, Characterization and Imaging of Biomaterials will address topics such as the characterization of implantable devices and their materials, optical micromanipulation for materials characterization, and the study of liquid-solid interfaces by optical/imaging methods.
Other areas to be discussed are the investigation of biological nanodiffractive materials/surfaces, and the visualization and evaluation of self-assembly processes of biological/polymeric matter at the nanoscale/microscale.
BiophotonicsImagingMaterialschemicalsnanoIndustry EventsEurope