Microscopy of Semiconducting Materials (MSM-XIX)

The bi-annual conference series 'Microscopy of Semiconducting Materials' has a long tradition in focusing on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important micro-characterization techniques including scanning probe microscopy and x-ray topography and diffraction will also be featured. Developments in materials science and technology covering the complete range of elemental and compound semiconductors and nano-structures thereof will be described.