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CIM 2017 International Metrology Congress

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September 19, 2017 - September 21, 2017
Porte de Versailles Exhibition Hall
PARIS
+33 467-06-2036

About this Event
This congress is a discussion forum between industry and research with oral and Poster presentations, round table sessions, as well as an exhibition showcasing innovations and measurement’s professionals. Attendees will explore developments in measurement techniques, research & development advances and their application for industry and demonstrate how measurement improves industrial process and risk management.


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