2017 International Conference on Frontiers of Characterization and Metrology for Nanoelectrics (FCMN)Mar. 21, 2017 - Mar. 23, 2017
Monterey, CA, United States
About this Event
The FCMN will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference will summarize major issues and provide critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nanoelectronics and beyond.