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FCMN 2017

2017 International Conference on Frontiers of Characterization and Metrology for Nanoelectrics (FCMN)

March 21, 2017 - March 23, 2017
Monterey Marriot
Monterey, CA, United States
AVS
+1 530-896-0477

About this Event
The FCMN will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference will summarize major issues and provide critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nanoelectronics and beyond.



FCMN 2017Industry Eventsmetrologynanoelectronicssemiconductor
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