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Scanning Probe Microscopes

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Bruker Nano Surfaces
Bruker Nano Surfaces - Tucson, AZ
Extensive suite of application-focused instrumentation for life sciences and materials research and production covers the full range of metrology techniques, sample sizes, and imaging resolutions. Technologies include AFMs, NanoIR spectrometers, fluorescence microscopes, stylus and optical profilers, mechanical testers, and nano-indenters.
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Glossary
  • scanning probe microscope See atomic force microscope; magnetic force microscope; near-field scanning optical microscope; scanning tunneling microscope.
  • atomic force microscope An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few...
  • magnetic force microscope A variation of the atomic force microscope that operates by scanning a tiny ferromagnetic probe (or a magnetized tip) over a magnetic sample, and detecting the extremely small forces exerted on the probe by the sample's stray magnetic fields. The...
  • near-field scanning optical microscope A scanning probe microscope that analyzes the surface of a specimen by recording the intensity of light as it is focused through a pipette and raster scanned across the specimen at a distance less than a wavelength. The resolution and high contrast...
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