Search
Menu
Optimax Systems, Inc. - Optical Components & Systems 2024 LB
Photonics Marketplace
Suppliers Products
Handbook Institutions Dictionary

Show Filters
10 products

Microscopy

Clear All Filters xSSC xMicroscopy x
MultiMode 8-HR
MultiMode 8-HR
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
  • Imaging Noise Level: <30 pm rms
  • Maximum Sample Size: 15 mm dia × 5 mm thick
JPK NanoWizard AFMs
JPK NanoWizard AFMs
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
Innova
Innova
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
  • Closed-Loop, Large-Area Scanner: XY >90 µm, Z >7.5 µm
  • Open-Loop, Small-Area Scanner: XY >5 µm, Z >1.5 µm
  • Sample Size: 45 mm × 45 mm x 18 mm
Dimension FastScan Bio
Dimension FastScan Bio
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
  • Sample Environment — Flow Cell: 60 μL
  • X-Y Tip-Velocity Max.: >2 mm/s
  • Z Range: ≥3 μm
Dimension FastScan
Dimension FastScan
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
  • Integral Nonlinearity XYZ: <0.50%
  • X-Y Scan Range: 90 μm × 90 μm typical
  • Z Range: 10 μm typical in imaging
Dimension Edge
Dimension Edge
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
  • X-Y Scan Range: 85 μm minimum
  • Z Range: 9.5 μm minimum
Ultima Multiphoton
Ultima Multiphoton
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
  • Scan Size: 64 x 64 to 2048 x 2048
  • Scanning Method: Pair of 6mm galvanometers
Dimension Icon
Dimension Icon
Bruker Nano Surfaces
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
  • Integral nonlinearity XYZ: <0.5% typical
  • X-Y scan range: 90 μm x 90 μm typical
  • Z range: 10 μm typical in imaging
Standard Microscope Spectroscopy (SMS) System
Standard Microscope Spectroscopy (SMS) System
HORIBA
  • Category: Microscopy / Other Microscopy Products
  • Type: Other
Active Cantilever Scanning Microscope
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
  • Category: Microscopy / Microscope Systems
  • Type: Scanning Probe
Microscopy Products


Explore Our Content
News
Features
Latest Products
Webinars
White Papers
All Things Photonics Podcast
Videos
Our Summits & Conferences
Industry Events
Bookstore
Join Our Community
Subscribe
Advertise
Become a member
Sign in
Contribute a Feature
Suggest a Webinar
Submit a Press Release
Mobile Apps

About Us
Our Company
Our Publications
Contact Us
Career Opportunities
Teddi C. Laurin Scholarship

Terms & Conditions
Privacy Policy
California Consumer Privacy Act (CCPA)



©2024 Photonics Media
100 West St.
Pittsfield, MA, 01201 USA
[email protected]
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.