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OSI Optoelectronics - Design & Manufacturing Standard Oct 22 MR
Bristol Instruments, Inc. - 872 Series High-Res 4/24 HP
7 products

Spectrometers

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Micro-Spectrometer: C12880MA
Micro-Spectrometer: C12880MA
Hamamatsu Corporation
  • Type: Portable
  • Measurement Techniques: Absorption,Emission,Reflectance and Transmission
  • Spectral Range (nm): 340 - 850
  • Max. Resolution (nm): 15
  • Pixel Count (total pixels): 288
  • Width: 20.1mm
  • Length: 12.5mm
VM200 VUV/UV Monochromater/Spectrometer
VM200 VUV/UV Monochromater/Spectrometer
Resonance Ltd.
  • Type: Benchtop
  • Measurement Techniques: Absorption,Emission,Fluorescence,Reflectance and Transmission
  • Spectral Range (nm): 20 - 3200
  • Max. Resolution (nm): 0.17
  • Width: 18cm
  • Height: 16cm
  • Weight (kg): 2.5
Model 234/302
Model 234/302
McPHERSON
  • Type: Benchtop
  • Measurement Techniques: Absorption,Emission,Fluorescence,Reflectance and Transmission,Inelastic Scattering,Raman,Other
  • Spectral Range (nm): 30 - 2200
  • Max. Resolution (nm): 0.05
  • Width: 30cm
  • Length: 30cm
  • Height: 30cm
  • Focal Length: 200 mm
  • High Vacuum 10e-6: UHV 10e-9 optional
  • Optical Design: Aberration corrected
Model 248/310
Model 248/310
McPHERSON
  • Type: Benchtop
  • Measurement Techniques: Absorption,Emission,Fluorescence,Reflectance and Transmission,Other
  • Spectral Range (nm): 0.98 - 310
  • Max. Resolution (nm): 0.007
  • Pixel Count (total pixels): 1.04858e+006
  • Width: 35cm
  • Length: 50cm
  • Angle of incidence: 87 degrees
  • Focal Length: 1 m
  • High vacuum: 10E6 (UHV optional)
HyperFlux™ U1
HyperFlux™ U1
Tornado Spectral Systems
  • Type: Benchtop
  • Measurement Techniques: Raman
  • Excitation Wavelength (nm): 785
  • Spectral Range (nm): 749 - 1024
  • Max. Resolution (nm): 0.38
  • Width: 50.8cm
  • Length: 29.8cm
  • Detector: Andor iDUS DU416A-LCD-DD
Aurora4000
Aurora4000
Changchun New Industries Optoelectronics Technology Co. Ltd.
  • Type: Portable
  • Measurement Techniques: Absorption,Fluorescence,FTIR,Mass Spectrometry,Reflectance and Transmission,Inelastic Scattering,Raman,Other
  • Spectral Range (nm): 200 - 1100
  • Max. Resolution (nm): 0.02
  • Pixel Count (total pixels): 3648
  • Width: 105mm
  • Length: 149mm
aRTie Thin-Film Measurement System
aRTie Thin-Film Measurement System
Filmetrics, KLA Instruments
  • Type: Benchtop
  • Measurement Techniques: Absorption,Reflectance and Transmission,Other
  • Spectral Range (nm): 380 - 1050
  • Thickness Accuracy: Greater of 0.2% or 2 nm
  • Thickness Range: 15nm - 70µm
Spectrometers Products


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