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Measurement Techniques

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Spectrometers

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Ocean SR2 Spectrometer
Ocean SR2 Spectrometer
Ocean Optics
  • Type: Benchtop
  • Spectral Range (nm): 185 - 1100
  • Max. Resolution (nm): 1.2
  • Width: 106.4mm
  • Length: 149mm
  • Height: 48.2mm
  • Weight (kg): 0.931
AvaSpec
AvaSpec
Anglia Instruments Ltd.
  • Type: Portable
  • Measurement Techniques: Absorption,Emission,Fluorescence,Reflectance and Transmission
  • Spectral Range (nm): 200 - 2500
CAS 125 - Array Spectroradiometer
CAS 125 - Array Spectroradiometer
Instrument Systems GmbH
  • Type: Portable
  • Measurement Techniques: Emission,Reflectance and Transmission,Other
  • Spectral Range (nm): 200 - 1100
  • Max. Resolution (nm): 3
  • Width: 233mm
  • Length: 325mm
  • Height: 137mm
  • CMOS sensor with thermal stabilization: 2048 pixels
  • Housing: robust, with smaller footprint
  • Integration Time: very short, down to 10 µs
Apollo Raman Microscope Spectrometer
Apollo Raman Microscope Spectrometer
CRAIC Technologies
  • Type: Benchtop
  • Measurement Techniques: Raman
HES2000
HES2000
IS Instruments Ltd.
  • Type: Benchtop
  • Measurement Techniques: Emission,Raman
  • Excitation Wavelength (nm): 785
  • Spectral Range (nm): 800 - 960
  • Max. Resolution (nm): 0.2
  • Pixel Count (total pixels): 2000
  • Width: 150mm
  • Detector: Andor iVac316
  • Fibre core diameter (mm): >=1 mm as standard
  • Fibre coupling: FC-PC/SMA
XDAL-SDD
XDAL-SDD
Fischer Technology Inc.
  • Type: Benchtop
  • Measurement Techniques: Fluorescence
Laser Elemental Analyzer LEA-S500
Laser Elemental Analyzer LEA-S500
SOL instruments Ltd.
  • Type: Portable
  • Measurement Techniques: Emission
  • Excitation Wavelength (nm): 1064
  • Spectral Range (nm): 165 - 880
  • Max. Resolution (nm): 0.022
  • Pixel Count (total pixels): 2048
  • Width: 600mm
  • Detectable Elements: from H to U
  • Detection Limits: from 0.1 ppm up to 100%
  • Layer-by-layer analysis: Yes
Beta PrstoSpectro
Beta PrstoSpectro
Beta Industries
  • Type: Portable
  • Measurement Techniques: Reflectance and Transmission
  • Excitation Wavelength (nm): 555
  • Spectral Range (nm): 400 - 700
  • Max. Resolution (nm): 16
  • Width: 7cm
  • Length: 12.5cm
F20 Thin-Film Measurement System
F20 Thin-Film Measurement System
Filmetrics, KLA Instruments
  • Type: Benchtop
  • Measurement Techniques: Absorption,Reflectance and Transmission,Other
  • Spectral Range (nm): 190 - 1690
  • Thickness Accuracy: As little as 1 nm or 0.2%
  • Thickness Range: 1 nm - 450 um
aRTie Thin-Film Measurement System
aRTie Thin-Film Measurement System
Filmetrics, KLA Instruments
  • Type: Benchtop
  • Measurement Techniques: Absorption,Reflectance and Transmission,Other
  • Spectral Range (nm): 380 - 1050
  • Thickness Accuracy: Greater of 0.2% or 2 nm
  • Thickness Range: 15nm - 70µm
Spectrometers Products


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