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Bristol Instruments, Inc. - 872 Series High-Res 4/24 LB
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Photonics Handbook

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Measuring Small-Beam MFD: Overcoming the ChallengesMeasuring Small-Beam MFD: Overcoming the Challenges
DERRICK PETERMAN, PhD, MKS Ophir
Profiling beams under 10 µm in size is one of the more challenging beam profiling applications. There are numerous reasons for this, including the very small size. Focal plane arrays commonly...
Laser Measurement Systems: Best PracticesLaser Measurement Systems: Best Practices
JOHN MCCAULEY, MKS Ophir
Given the pace at which technology advances, there always seems to be a learning curve. With the abundance of consumer electronics available, there typically is no right or wrong way to use these...
Lasers for Microscopy: Major TrendsLasers for Microscopy: Major Trends
Marco Arrigoni, Nigel Gallaher, Darryl McCoy, Volker Pfeufer, Matthias Schulze, and Daniel Callen, Coherent Inc.
Laser development for the microscopy market continues to be driven by key trends in applications, which currently include superresolution techniques, multiphoton applications in optogenetics and...
Detectors: CCDs for Life-Science ApplicationsDetectors: CCDs for Life-Science Applications
Butch Moomaw, Hamamatsu Corporation, Systems Div.
Since their invention in the late 1960s, charge-coupled devices, also called CCDs, have found widespread use in imaging applications. Electronic cameras based on CCD technology are used in...
Infrared System Design: Understanding the ProcessInfrared System Design: Understanding the Process
William L. Wolfe, Professor Emeritus, University of Arizona, Optical Sciences Center
Infrared system design is not, like some circuit design, a synthetic process. One cannot start by stating the problem and proceeding in an orderly fashion to a final solution. Rather, we guess a...
Broadband Spectrophotometry: A Fast, Simple, Accurate ToolBroadband Spectrophotometry: A Fast, Simple, Accurate Tool
Iris Bloomer, n&k Technology, Inc.; Rebecca Mirsky, Al Shugart International
Designing devices that incorporate ultrathin films is an important means of enhancing yields. However, characterizing ultrathin films provides a challenge for mainstream metrology tools such as...
Spectrum Analysis for DWDM: New Instruments Meet the ChallengeSpectrum Analysis for DWDM: New Instruments Meet the Challenge
Francis Audet, EXFO
As system and cable installers try to optimize their links, the preferred method has become high-speed DWDM. This demand for bandwidth has led to the development of new test and measurement...
Photonics Handbook

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