Live Next Week: Explore emerging test and measurement protocols with 4 exclusive presentations
Register
Sign In
Suppliers
Products
Categories
Handbook
Dictionary
Careers
Resources
Photonics Spectra
BioPhotonics
Vision Spectra
Virtual Events & Summits
Educational Institutions
Add/Update Your Listing
Exhibitor Listing Portal
Become an Exhibitor
Buyers' Guide Print Edition
Subscribe
Advertise
Suppliers
Products
Categories
Handbook
Dictionary
Careers
Resources
Photonics Spectra
BioPhotonics
Vision Spectra
Virtual Events & Summits
Educational Institutions
Add/Update Your Listing
Exhibitor Listing Portal
Become an Exhibitor
Buyers' Guide Print Edition
Register
Sign In
Photonics Marketplace
Suppliers
Products
Handbook
Institutions
Dictionary
Show Filters
Hide Filters
Sections
Coatings
Communications
Fiber Optics
Imaging
Lasers
Light Sources
Materials
Microscopy
Optics
Positioning
Sensors & Detectors
Spectroscopy
Test & Measurement
General Reference
21 articles
Photonics Handbook
Clear All Filters x
optical instrument tools x
Diffraction Gratings: Selection Guidelines
David Ventola, Optometrics Corp., an Omega Optical Holdings company
Diffraction gratings are optical components with a periodic structure that separate light into beams traveling in predictable directions based on their wavelength. The grating acts as the dispersive...
Optical System Optimization: Analyzing the Effects of Stray Light
Richard Pfisterer, Photon Engineering LLC
Electrical engineers are very familiar with the effects of shot noise, thermal noise, flicker noise and crosstalk, and recognize how these effects can reduce the signal-to-noise ratio (SNR) in their...
Superresolution Microscopy: An Imaging Revolution
Marie Freebody, Contributing Editor
Superresolution optical microscopy, for which the Nobel Prize was awarded to Eric Betzig, Stefan Hell, and William Moerner in 2014, has been one of the most momentous developments in the life...
Fluorescence Lifetime Imaging: Choosing the Best Approach
GERHARD HOLST, Excelitas PCO GmbH
The term fluorescence is often applied as a synonym for photoluminescence, although luminescence actually covers fluorescence and phosphorescence. Both of these terms describe the process of...
Tunable Light Sources: A Popular Choice for Measurement Applications
VICKI LU and JOHN PARK, PhD, MKS/Newport
Many common spectroscopic measurements require the coordinated operation of a detection instrument and light source, as well as data acquisition and processing. Integration of individual components...
Measuring Surface Roughness: The Benefits of Laser Confocal Microscopy
ROBERT BELLINGER, Evident
When evaluating the surface of a component, surface roughness can be assessed by eye or by rubbing it with a fingertip. Common expressions include “shiny,” “lusterless and...
Nanopositioning: A Step Ahead
Scott Jordan, Brian Lula, and Stefan Vorndran, PI (Physik Instrumente) LP
By its original definition, a nanopositioning device is a mechanism capable of repeatedly delivering motion in increments as small as one nanometer. Lately demands from industry and research have...
Understanding Surface Quality: A Practical Guide
John C. Smith, Rocky Mountain Instrument Co. (RMI)
Surface quality has become one of the most poorly understood specifications in the optics industry. A significant portion of the confusion stems from the two major competing (and largely...
Vibration Control: Limiting Mechanical Noise
MKS/Newport
In general, there are three common approaches to reducing mechanical excitation of photonic systems. The first is identifying the sources of vibration and implementing ways to eliminate or reduce...
Lasers: Understanding the Basics
Coherent Inc.
Over 60 years have passed since the first demonstration of a laser in 1960. After the initial spark of interest, lasers were for a while categorized as “a solution waiting for a problem,”...
Beryllium Mirrors: Refinements Enable New Applications
Vladimir Vudler and Peter Richard, Hardric Laboratories, Inc.
With a specific gravity of 1.85 g/cm3, beryllium is the lightest metal that is workable. It is 45 percent lighter than aluminum and approximately five times as stiff. Its stiffness to weight ratio...
Positioning System Performance: Understanding the Rules
MKS/Newport
Abbe Error — Linear off-axis errors introduced by angular deviations coupled to a moment arm at the point of interest on stage mounted devices (θ in Figure 1). The effect of Abbe error...
Component Choices: Avoiding Tolerancing Mistakes
Warren J. Smith, Rockwell Collins Optronics
To the novice or casual user of optics, the acquisition of an optical system can be a very difficult experience. Failure to understand the ground rules can result in unnecessarily high cost, late...
Hyperspectral Imaging Spectroscopy: A Look at Real-Life Applications
Dr. John R. Gilchrist, Clyde HSI; Timo Hyvärinen, Spectral Imaging Ltd.
Hyperspectral imaging spectroscopy has developed dramatically from a large, complex, remote-sensing satellite- or aircraft-based system into a rugged, compact, economically priced imaging and...
Broadband Spectrophotometry: A Fast, Simple, Accurate Tool
Iris Bloomer, n&k Technology, Inc.; Rebecca Mirsky, Al Shugart International
Designing devices that incorporate ultrathin films is an important means of enhancing yields. However, characterizing ultrathin films provides a challenge for mainstream metrology tools such as...
Spectroscopy: The Tools of the Trade
Dr. John R. Gilchrist, Clyde HSI
All optical spectrometry techniques rely on the measurement of radiant power. The configuration of the instrument varies based on the measurement technique: absorption, emission, luminescence, or...
Diamond Machining: Ultraprecision Machine Technology
Engineering Staff, AMETEK Precitech, Inc.
Ultraprecision machining can be defined in general terms as the removal of material from a substrate utilizing a machine tool that operates at a resolution of 10 nm (0.4 μin.) or less. The...
Spectroscopy: Mastering the Techniques
Dr. John R. Gilchrist, Clyde HSI
The scope of optical spectroscopic instrumentation is indeed very broad. Many analytical methods rely on the interaction of radiation with matter and are often described in the context of quantum and...
SWIR Imaging: An Industrial Processing Tool
Sensors Unlimited Inc., A Collins Aerospace company
Imaging has long been used in industrial processes to measure, monitor, control, or otherwise manage the production of goods. The challenge to the process designer is to develop a tool that captures...
NSOM: Discovering New Worlds
M. Kovar, Midako A. Nohe, N.O. Petersen and P.R. Norton, University of Western Ontario
NSOM is suitable for studies on the mesoscopic scale (several tens to hundreds of molecular dimensions). It has become an important tool in research and applications of semiconductors, organic layers...
Characterizing High-Speed Transmitters: The Emphasis Is on Waveforms
Greg D. Le Cheminant, Agilent Technologies
An indicator of how well the entire system performs is a measurement called bit-error-ratio (BER). Acceptable BERs range from one error per billion to one per trillion bits transmitted. It is rare...
Photonics Handbook
Explore Our Content
News
Features
Latest Products
Webinars
White Papers
All Things Photonics Podcast
Videos
Our Summits & Conferences
Industry Events
Bookstore
Join Our Community
Subscribe
Advertise
Become a member
Sign in
Contribute a Feature
Suggest a Webinar
Submit a Press Release
Mobile Apps
About Us
Our Company
Our Publications
Contact Us
Career Opportunities
Teddi C. Laurin Scholarship
Terms & Conditions
Privacy Policy
California Consumer Privacy Act (CCPA)
©2024 Photonics Media
100 West St.
Pittsfield, MA, 01201 USA
[email protected]
We use cookies to improve user experience and analyze our website traffic as stated in our
Privacy Policy
. By using this website, you agree to the use of
cookies
unless you have disabled them.