Zurich Instruments AG - Lock-In Amplifiers 4/24 LB

21 products

Photonics Products

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Continuous Wave (CW) Laser Modules
ProPhotonix Ltd.

Category: Lasers / Lasers & Laser Systems
Type: Diode
Max. Power: 500mW
Wavelength: 405 - 1319nm
Operating Mode: Continuous

ZL41 Cell
Andor Technology

Category: Cameras & Imaging / Cameras
Type: sCMOS

H112 ProScan Stage
Prior Scientific Inc.

Category: Optomechanics & Positioning / Stages
Type: Linear Stage
Max. Load: 25kg
X-Axis Travel Length: 302mm
Y-Axis Travel Length: 302mm
Stage Type: Motorized
Linear Slides: 4 mm precision bearings
Minimum Step Size: 0.04 µm
Stepper Motor: High precision stepper

NanoCube P-616
PI (Physik Instrumente) LP, Motion Control, Air Bearings, Piezo Mechanics

Category: Optomechanics & Positioning / Stages
Type: Nanopositioning Stage
Max. Load: 100g
Mass: 0.08kg
Height: 4cm
X-Axis Travel Length: 0.1mm
Y-Axis Travel Length: 0.1mm
Z-Axis Travel Length: 0.1mm
Linearity Error (entire travel range): 0.1%
Min. Incremental Motion: 0.2 nm
Sensor Type: acitive sensor

MultiMode 8-HR
Bruker Nano Surfaces

Category: Microscopy / Microscope Systems
Type: Scanning Probe
Imaging Noise Level: <30 pm rms
Maximum Sample Size: 15 mm dia × 5 mm thick

JPK NanoWizard AFMs
Bruker Nano Surfaces

Category: Microscopy / Microscope Systems
Type: Scanning Probe

Innova
Bruker Nano Surfaces

Category: Microscopy / Microscope Systems
Type: Scanning Probe
Closed-Loop, Large-Area Scanner: XY >90 µm, Z >7.5 µm
Open-Loop, Small-Area Scanner: XY >5 µm, Z >1.5 µm
Sample Size: 45 mm × 45 mm x 18 mm

Dimension FastScan Bio
Bruker Nano Surfaces

Category: Microscopy / Microscope Systems
Type: Scanning Probe
Sample Environment — Flow Cell: 60 μL
X-Y Tip-Velocity Max.: >2 mm/s
Z Range: ≥3 μm

Dimension FastScan
Bruker Nano Surfaces

Category: Microscopy / Microscope Systems
Type: Scanning Probe
Integral Nonlinearity XYZ: <0.50%
X-Y Scan Range: 90 μm × 90 μm typical
Z Range: 10 μm typical in imaging

Dimension Edge
Bruker Nano Surfaces

Category: Microscopy / Microscope Systems
Type: Scanning Probe
X-Y Scan Range: 85 μm minimum
Z Range: 9.5 μm minimum

Ultima Multiphoton
Bruker Nano Surfaces

Category: Microscopy / Microscope Systems
Type: Scanning Probe
Scan Size: 64 x 64 to 2048 x 2048
Scanning Method: Pair of 6mm galvanometers

Dimension Icon
Bruker Nano Surfaces

Category: Microscopy / Microscope Systems
Type: Scanning Probe
Integral nonlinearity XYZ: <0.5% typical
X-Y scan range: 90 μm x 90 μm typical
Z range: 10 μm typical in imaging

H117 ProScan Stage
Prior Scientific Inc.

Category: Optomechanics & Positioning / Stages
Type: Linear Stage
Max. Load: 10kg
X-Axis Travel Length: 114mm
Y-Axis Travel Length: 75mm
Max. Linear Speed: 100mm/s
Stage Type: Motorized
Max. Resolution: up to 10 nm
Repeatability: ±0.7 µm

H101A ProScan™ Stage
Prior Scientific Inc.

Category: Optomechanics & Positioning / Stages
Type: Linear Stage
Max. Load: 10kg
Height: 68cm
X-Axis Travel Length: 114mm
Y-Axis Travel Length: 75mm
Stage Type: Motorized
Driver Included?: Yes
Minimum Step Size: 0.01 µm
XY Repeatability: 0.7 µm

H107 ProScan Stage
Prior Scientific Inc.

Category: Optomechanics & Positioning / Stages
Type: Linear Stage
Max. Load: 10kg
Height: 63mm
X-Axis Travel Length: 112mm
Y-Axis Travel Length: 70mm
Stage Type: Motorized
Linear Slides: 3 mm precision bearings
Minimum Step Size: 0.04 µm
Stepper Motor: 4 phase, 1 amp per phase micro stepping

488 nm Laser (PM Fiber; MatchBox 2)
Integrated Optics UAB

Category: Lasers / Lasers & Laser Systems
Type: Diode
Max. Power: 20mW
Classification (IEC): Class 3B
Wavelength: 485 - 488.2nm
Wavelength - Tunable?: No
Operating Mode: Continuous
Beam Diam.: 1mm
Beam Quality, M2: <1.1
Noise (20 Hz-20 MHz): <0.2 %
Power Stability RMS, 8hrs: <2 %

Tungsten Filament Scanning Electron Microscope SEM3200
CIQTEK

Category: Microscopy / Microscope Systems
Type: Electron
Acceleration Voltage: 0.2 kV-30 kV
Extension: SE\BSE\EDS\EDX\EBSD, etc.
Low Vacuum Mode: 3 nm @ 30 kV (SE)

Field Emission Scanning Electron Microscope SEM5000
CIQTEK

Category: Microscopy / Microscope Systems
Type: Electron
Acceleration Voltage: 20 V ~ 30 kV
Electron Gun: High-brightness Schottky
Magnification: 1 ~ 2,500,000 ×

TopMap Micro.View 3D Optical Profiler
Polytec Inc.

Category: Microscopy / Other Microscopy Products
Type: Other

Active Cantilever Scanning Microscope
Seiwa Optical America Inc.

Category: Microscopy / Microscope Systems
Type: Scanning Probe

96SLM100-LE2
Ludl Electronic Products Ltd.

Category: Optomechanics & Positioning / Stages
Type: Linear Stage
Max. Load: 2kg
Mass: 1.8kg
Height: 22mm
X-Axis Travel Length: 100mm
Y-Axis Travel Length: 75mm
Max. Linear Speed: 100mm/s

Photonics Products

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