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Alluxa - Optical Coatings LB 8/23
Photonics Marketplace
7 articles

Photonics Handbook

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Tunable Light Sources: A Popular Choice for Measurement ApplicationsTunable Light Sources: A Popular Choice for Measurement Applications
VICKI LU and JOHN PARK, PhD, MKS/Newport
Many common spectroscopic measurements require the coordinated operation of a detection instrument and light source, as well as data acquisition and processing. Integration of individual components...
Nanopositioning: A Step AheadNanopositioning: A Step Ahead
Scott Jordan, Brian Lula, and Stefan Vorndran, PI (Physik Instrumente) LP
By its original definition, a nanopositioning device is a mechanism capable of repeatedly delivering motion in increments as small as one nanometer. Lately demands from industry and research have...
Excimer Optics: High Power Demands High ReliabilityExcimer Optics: High Power Demands High Reliability
Michael A. Case, Teledyne Princeton Instruments, Business Unit of Teledyne Technologies
The first high-reflectance mirror coatings for the UV and vacuum UV (VUV) were of the Al + MgF2 type produced in the late 1950s. Coatings of this design are still used today for multigas cavity...
Beryllium Mirrors: Refinements Enable New ApplicationsBeryllium Mirrors: Refinements Enable New Applications
Vladimir Vudler and Peter Richard, Hardric Laboratories, Inc.
With a specific gravity of 1.85 g/cm3, beryllium is the lightest metal that is workable. It is 45 percent lighter than aluminum and approximately five times as stiff. Its stiffness to weight ratio...
Spectroscopy: The Tools of the TradeSpectroscopy: The Tools of the Trade
Dr. John R. Gilchrist, Clyde HSI
All optical spectrometry techniques rely on the measurement of radiant power. The configuration of the instrument varies based on the measurement technique: absorption, emission, luminescence, or...
Broadband Spectrophotometry: A Fast, Simple, Accurate ToolBroadband Spectrophotometry: A Fast, Simple, Accurate Tool
Iris Bloomer, n&k Technology, Inc.; Rebecca Mirsky, Al Shugart International
Designing devices that incorporate ultrathin films is an important means of enhancing yields. However, characterizing ultrathin films provides a challenge for mainstream metrology tools such as...
Dynamic Interferometry: Getting Rid of the JittersDynamic Interferometry: Getting Rid of the Jitters
John Hayes and James Millerd, 4D Technology Corporation
Conditions on the factory floor and in industrial cleanrooms with high-capacity air filtration systems can hamper the use of interferometry. Another problem is the testing of large-aperture mirrors...
Photonics Handbook

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