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Twyman-Green Interferometers

A Twyman-Green interferometer is a testing device that provides a contour map of the emergent wavefront for the observer in terms of the given wavelength of the light.

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4D Technology Corp.
4D Technology Corp. - Tucson, AZ
Designs and manufactures dynamic laser interferometers and optical profilers, and surface defect gauges. Applications include precision machined surfaces, optics, astronomy, aerospace, space-based telescopes, flexible electronics, automotive, and in-line production measurement.
Custom Manufacturer
1 product
TRIOPTICS GmbH
TRIOPTICS GmbH - Wedel, Germany
Our measurement and manufacturing systems speed up and improve the development, production, and quality control of lenses, optical lens systems, and camera modules around the world. With our broad knowledge base, comprehensive product range, and international focus, we create lasting customer value and benefits.
Stock Manufacturer
Armstrong Optical Ltd. - Northampton, United Kingdom
Chronos Photonics - Orlando, FL
Direct Optical Research Co. - Largo, FL
LightGage Inc. - Wayland, NY
M3 Measurement Solutions Inc. - Escondido, CA
Metrology Concepts - Rochester, NY
Optocraft GmbH - Erlangen, Germany
Glossary
  • Twyman-Green interferometer A testing device that provides a contour map of the emergent wavefront for the observer in terms of the given wavelength of the light.
  • interferometer An interferometer is a scientific instrument that utilizes the principle of interference to measure differences in the path length, wavelength, phase, or amplitude of coherent electromagnetic waves. It typically consists of components such as a...
  • Twyman-Green interferometry Twyman-Green interferometry is a technique used in optics to measure the flatness or surface profile of optical components with high precision. It is based on the principles of interference of light waves. In a Twyman-Green interferometer, a...
Twyman-Green Interferometers Supplierstesting devicesurface profilinglaser interferometersurface measurementoptical surface measurementinterference of light waveswavefront sensingopticsmetrology

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