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Atomic Force Microscopes

An atomic force microscope is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few nanometers in diameter) over the surface of a sample at a very close distance. The tip interacts with the sample's surface forces, providing detailed information about the sample's topography and properties at the nanoscale. Learn more about atomic force microscopes →

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Bruker Nano Surfaces
Bruker Nano Surfaces - Tucson, AZ
Extensive suite of application-focused instrumentation for life sciences and materials research and production covers the full range of metrology techniques, sample sizes, and imaging resolutions. Technologies include AFMs, NanoIR spectrometers, fluorescence microscopes, stylus and optical profilers, mechanical testers, and nano-indenters.
Supplier/Distributor
13 products
K-Tek Nanotechnology LLC - Wilsonville, OR
Molecular Vista Inc. - San Jose, CA
Oxford Instruments Asylum Research - Santa Barbara, CA
Glossary
  • atomic force microscope An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few...
Atomic Force Microscopes SuppliersAFMthree-dimensional image3-D image3D imageflexible cantileverdeflectionmicroscopyimagingscientific

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