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PI Physik Instrumente - Semiconductor Applications 5/24 LW LB
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8 articles

Test & Measurement Articles

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Measuring Aspheres: Selecting the Best TechniqueMeasuring Aspheres: Selecting the Best Technique
AMY FRANTZ, EDMUND OPTICS INC.
The benefits of aspheric lenses are numerous: They allow for a reduction in spherical aberrations and are ideal for focusing or collimating light, as they can achieve a low ƒ-number. Aspheres...
Measuring Surface Roughness: The Benefits of Laser Confocal MicroscopyMeasuring Surface Roughness: The Benefits of Laser Confocal Microscopy
ROBERT BELLINGER, Evident
When evaluating the surface of a component, surface roughness can be assessed by eye or by rubbing it with a fingertip. Common expressions include “shiny,” “lusterless and...
Measuring Small-Beam MFD: Overcoming the ChallengesMeasuring Small-Beam MFD: Overcoming the Challenges
DERRICK PETERMAN, PhD, MKS Ophir
Profiling beams under 10 µm in size is one of the more challenging beam profiling applications. There are numerous reasons for this, including the very small size. Focal plane arrays commonly...
Laser Measurement Systems: Best PracticesLaser Measurement Systems: Best Practices
JOHN MCCAULEY, MKS Ophir
Given the pace at which technology advances, there always seems to be a learning curve. With the abundance of consumer electronics available, there typically is no right or wrong way to use these...
Understanding Surface Quality: A Practical GuideUnderstanding Surface Quality: A Practical Guide
John C. Smith, Rocky Mountain Instrument Co. (RMI)
Surface quality has become one of the most poorly understood specifications in the optics industry. A significant portion of the confusion stems from the two major competing (and largely...
Broadband Spectrophotometry: A Fast, Simple, Accurate ToolBroadband Spectrophotometry: A Fast, Simple, Accurate Tool
Iris Bloomer, n&k Technology, Inc.; Rebecca Mirsky, Al Shugart International
Designing devices that incorporate ultrathin films is an important means of enhancing yields. However, characterizing ultrathin films provides a challenge for mainstream metrology tools such as...
Colorimetry: How to Measure Color DifferencesColorimetry: How to Measure Color Differences
Konica Minolta Sensing Americas Inc.
The use and importance of colorimetry has grown in unison with the increase of global manufacturing and processing. When plastic automotive trim produced on one continent must match a painted metal...
NSOM: Discovering New WorldsNSOM: Discovering New Worlds
M. Kovar, Midako A. Nohe, N.O. Petersen and P.R. Norton, University of Western Ontario
NSOM is suitable for studies on the mesoscopic scale (several tens to hundreds of molecular dimensions). It has become an important tool in research and applications of semiconductors, organic layers...
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