Search
Menu
Zurich Instruments AG - Lock-In Amplifiers 4/24 LB
Photonics Marketplace
7 articles

Test & Measurement Articles

Clear All Filters xphase xTest & Measurement x
Measuring Aspheres: Selecting the Best TechniqueMeasuring Aspheres: Selecting the Best Technique
AMY FRANTZ, EDMUND OPTICS INC.
The benefits of aspheric lenses are numerous: They allow for a reduction in spherical aberrations and are ideal for focusing or collimating light, as they can achieve a low ƒ-number. Aspheres...
Understanding Surface Quality: A Practical GuideUnderstanding Surface Quality: A Practical Guide
John C. Smith, Rocky Mountain Instrument Co. (RMI)
Surface quality has become one of the most poorly understood specifications in the optics industry. A significant portion of the confusion stems from the two major competing (and largely...
Interferometry: Measuring with LightInterferometry: Measuring with Light
Zygo Corporation
An interferometer is an instrument that compares the position or surface structure of two objects. The basic two-beam division of amplitude interferometer components consists of a light source, a...
Optical Delay Lines: Key to Time-Resolved MeasurementsOptical Delay Lines: Key to Time-Resolved Measurements
MKS/Newport
One of the most critical elements of any time-resolved spectroscopy and dynamics experiment is the optical delay line. A typical optical delay line consists of a retroreflector or folding mirrors on...
Broadband Spectrophotometry: A Fast, Simple, Accurate ToolBroadband Spectrophotometry: A Fast, Simple, Accurate Tool
Iris Bloomer, n&k Technology, Inc.; Rebecca Mirsky, Al Shugart International
Designing devices that incorporate ultrathin films is an important means of enhancing yields. However, characterizing ultrathin films provides a challenge for mainstream metrology tools such as...
Spectroscopy: The Tools of the TradeSpectroscopy: The Tools of the Trade
Dr. John R. Gilchrist, Clyde HSI
All optical spectrometry techniques rely on the measurement of radiant power. The configuration of the instrument varies based on the measurement technique: absorption, emission, luminescence, or...
Dynamic Interferometry: Getting Rid of the JittersDynamic Interferometry: Getting Rid of the Jitters
John Hayes and James Millerd, 4D Technology Corporation
Conditions on the factory floor and in industrial cleanrooms with high-capacity air filtration systems can hamper the use of interferometry. Another problem is the testing of large-aperture mirrors...
Photonics HandbookTest & Measurement

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.