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Test & Measurement Articles

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Measuring Aspheres: Selecting the Best TechniqueMeasuring Aspheres: Selecting the Best Technique
AMY FRANTZ, EDMUND OPTICS INC.
The benefits of aspheric lenses are numerous: They allow for a reduction in spherical aberrations and are ideal for focusing or collimating light, as they can achieve a low ƒ-number. Aspheres...
Measuring Surface Roughness: The Benefits of Laser Confocal MicroscopyMeasuring Surface Roughness: The Benefits of Laser Confocal Microscopy
ROBERT BELLINGER, Evident
When evaluating the surface of a component, surface roughness can be assessed by eye or by rubbing it with a fingertip. Common expressions include “shiny,” “lusterless and...
Measuring Small-Beam MFD: Overcoming the ChallengesMeasuring Small-Beam MFD: Overcoming the Challenges
DERRICK PETERMAN, PhD, MKS Ophir
Profiling beams under 10 µm in size is one of the more challenging beam profiling applications. There are numerous reasons for this, including the very small size. Focal plane arrays commonly...
Aspheric Lenses: Optimizing the DesignAspheric Lenses: Optimizing the Design
Jeremy Govier, Edmund Optics Inc.
With the understanding of aspheric lens manufacturing provided in part one of this article, designers have the tools to optimize their aspheres; the next step is to understand how to specify and...
Interferometry: Measuring with LightInterferometry: Measuring with Light
Zygo Corporation
An interferometer is an instrument that compares the position or surface structure of two objects. The basic two-beam division of amplitude interferometer components consists of a light source, a...
Optical Delay Lines: Key to Time-Resolved MeasurementsOptical Delay Lines: Key to Time-Resolved Measurements
MKS/Newport
One of the most critical elements of any time-resolved spectroscopy and dynamics experiment is the optical delay line. A typical optical delay line consists of a retroreflector or folding mirrors on...
Imaging Colorimetry: Accuracy in Display and Light Source MetrologyImaging Colorimetry: Accuracy in Display and Light Source Metrology
Ron Rykowski and Hubert Kostal, Radiant Imaging, Inc.
The market for flat panel displays (FPDs) has undergone tremendous growth, driven mostly by increased demand for televisions, cell phones, computers, digital cameras and MP3 players. Similarly,...
Spectroscopy: The Tools of the TradeSpectroscopy: The Tools of the Trade
Dr. John R. Gilchrist, Clyde HSI
All optical spectrometry techniques rely on the measurement of radiant power. The configuration of the instrument varies based on the measurement technique: absorption, emission, luminescence, or...
Dynamic Interferometry: Getting Rid of the JittersDynamic Interferometry: Getting Rid of the Jitters
John Hayes and James Millerd, 4D Technology Corporation
Conditions on the factory floor and in industrial cleanrooms with high-capacity air filtration systems can hamper the use of interferometry. Another problem is the testing of large-aperture mirrors...
NSOM: Discovering New WorldsNSOM: Discovering New Worlds
M. Kovar, Midako A. Nohe, N.O. Petersen and P.R. Norton, University of Western Ontario
NSOM is suitable for studies on the mesoscopic scale (several tens to hundreds of molecular dimensions). It has become an important tool in research and applications of semiconductors, organic layers...
Particle Image Velocimetry: Basics, Developments and TechniquesParticle Image Velocimetry: Basics, Developments and Techniques
M. Kelnberger, InnoLas GmbH; G. Schwitzgebel, Universität Mainz
Particle image velocimetry (PIV) is an experimental tool in fluid mechanics and aerodynamics. The basic principle involves photographic recording of the motion of microscopic particles that follow...
Spectrum Analysis for DWDM: New Instruments Meet the ChallengeSpectrum Analysis for DWDM: New Instruments Meet the Challenge
Francis Audet, EXFO
As system and cable installers try to optimize their links, the preferred method has become high-speed DWDM. This demand for bandwidth has led to the development of new test and measurement...
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