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11 products

Microscopy

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MultiMode 8-HR
MultiMode 8-HR
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Imaging Noise Level: <30 pm rms
  • Maximum Sample Size: 15 mm dia × 5 mm thick
JPK NanoWizard AFMs
JPK NanoWizard AFMs
Bruker Nano Surfaces
  • Type: Scanning Probe
Innova
Innova
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Closed-Loop, Large-Area Scanner: XY >90 µm, Z >7.5 µm
  • Open-Loop, Small-Area Scanner: XY >5 µm, Z >1.5 µm
  • Sample Size: 45 mm × 45 mm x 18 mm
Dimension FastScan Bio
Dimension FastScan Bio
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Sample Environment — Flow Cell: 60 μL
  • X-Y Tip-Velocity Max.: >2 mm/s
  • Z Range: ≥3 μm
Dimension FastScan
Dimension FastScan
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Integral Nonlinearity XYZ: <0.50%
  • X-Y Scan Range: 90 μm × 90 μm typical
  • Z Range: 10 μm typical in imaging
Dimension Edge
Dimension Edge
Bruker Nano Surfaces
  • Type: Scanning Probe
  • X-Y Scan Range: 85 μm minimum
  • Z Range: 9.5 μm minimum
Ultima Multiphoton
Ultima Multiphoton
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Scan Size: 64 x 64 to 2048 x 2048
  • Scanning Method: Pair of 6mm galvanometers
Dimension Icon
Dimension Icon
Bruker Nano Surfaces
  • Type: Scanning Probe
  • Integral nonlinearity XYZ: <0.5% typical
  • X-Y scan range: 90 μm x 90 μm typical
  • Z range: 10 μm typical in imaging
Tungsten Filament Scanning Electron Microscope SEM3200
Tungsten Filament Scanning Electron Microscope SEM3200
CIQTEK
  • Type: Electron
  • Acceleration Voltage: 0.2 kV-30 kV
  • Extension: SE\BSE\EDS\EDX\EBSD, etc.
  • Low Vacuum Mode: 3 nm @ 30 kV (SE)
Field Emission Scanning Electron Microscope SEM5000
Field Emission Scanning Electron Microscope SEM5000
CIQTEK
  • Type: Electron
  • Acceleration Voltage: 20 V ~ 30 kV
  • Electron Gun: High-brightness Schottky
  • Magnification: 1 ~ 2,500,000 ×
Active Cantilever Scanning Microscope
Active Cantilever Scanning Microscope
Seiwa Optical America Inc.
  • Type: Scanning Probe
Microscopy Products


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