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Lambda Research Optics, Inc. - Limited Time Offer
Photonics Marketplace
6 products

Spectroscopy

Clear All Filters xwavelength measurement xSpectroscopy x
WP Raman Series Spectrometers
WP Raman Series Spectrometers
Wasatch Photonics Inc.
  • Type: Portable
  • Measurement Techniques: Raman
  • Excitation Wavelength (nm): 785
  • Spectral Range (nm): 100 - 3600
  • Max. Resolution (nm): 7
  • Pixel Count (total pixels): 2048
  • Width: 13.5cm
  • Detector Cooling: Optional to -15°c
  • Integrated Laser: optional
  • Numerical Aperture: f/1.3
WaveCapture FBG Analyzer System
WaveCapture FBG Analyzer System
BaySpec Inc.
  • Type: System
  • Channel Number: 1 or 4
  • Frequency Response Time: up to 5 kHz
  • Readout Resolution: 1 pm
HyperFlux™ U1
HyperFlux™ U1
Tornado Spectral Systems
  • Type: Benchtop
  • Measurement Techniques: Raman
  • Excitation Wavelength (nm): 785
  • Spectral Range (nm): 749 - 1024
  • Max. Resolution (nm): 0.38
  • Width: 50.8cm
  • Length: 29.8cm
  • Detector: Andor iDUS DU416A-LCD-DD
NS MiniTracer
NS MiniTracer
Applied NanoFluorescence LLC
  • Type: Benchtop
  • Measurement Techniques: Absorption,Emission,Fluorescence
  • Excitation Wavelength (nm): 638
  • Spectral Range (nm): 900 - 1600
  • Max. Resolution (nm): 5
  • Pixel Count (total pixels): 512
  • Width: 182mm
  • Absorption Option: 900-1600 nm
  • Near-Infrared Emission: 900-1600 nm
F20 Thin-Film Measurement System
F20 Thin-Film Measurement System
Filmetrics, KLA Instruments
  • Type: Benchtop
  • Measurement Techniques: Absorption,Reflectance and Transmission,Other
  • Spectral Range (nm): 190 - 1690
  • Thickness Accuracy: As little as 1 nm or 0.2%
  • Thickness Range: 1 nm - 450 um
aRTie Thin-Film Measurement System
aRTie Thin-Film Measurement System
Filmetrics, KLA Instruments
  • Type: Benchtop
  • Measurement Techniques: Absorption,Reflectance and Transmission,Other
  • Spectral Range (nm): 380 - 1050
  • Thickness Accuracy: Greater of 0.2% or 2 nm
  • Thickness Range: 15nm - 70µm
Spectroscopy Products

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