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WHITE PAPER: Electro-Optical Measurements Using Vector Network Analyzers (7/10/2018)

WHITE PAPER: Electro-Optical Measurements Using Vector Network Analyzers
As the data rates of optical communication systems continue to increase, optical transmit and receive modules require characterization to wider bandwidths.
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Tuesday, July 10, 2018
         
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Electro-Optical Measurements Using Vector Network Analyzers

As the data rates of optical communication systems continue to increase, optical transmit and receive modules require characterization to wider bandwidths. Optical modulators (E/O devices), photo detectors and receivers (O/E devices), as well as optical components can be characterized accurately using Vector Network Analyzers (VNA's). This application note describes the techniques and hardware required to characterize E/O and O/E devices, as well as optical components with economies of scale and flexibility not present in current Lightwave Component Analyzer (LCA) designs.

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Electro-Optical Measurements Using Vector Network Analyzers
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