< More White Papers & Application NotesSubscribe to our E-NewslettersAPPLICATION NOTES: High-Resolution Chemical Imaging with Tapping AFM-IR (4/16/2019)
APPLICATION NOTES: High-Resolution Chemical Imaging with Tapping AFM-IR
APPLICATION NOTES: High-Resolution Chemical Imaging with Tapping AFM-IR
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High-Resolution Chemical Imaging with Tapping AFM-IR
Where the spatial resolution of conventional bulk IR spectroscopy is limited by diffraction to ~3-10 µm, atomic force microscopy (AFM) provides a nanoscale topographic map of a sample surface. However, AFM has been unable traditionally to chemically characterize materials. This article discusses Tapping AFM-IR, which is a photothermal technique that combines AFM and IR spectroscopy to unambiguously identify the chemical composition of a sample with tens-of-nanometers spatial resolution.
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