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WHITE PAPERS & APPLICATION NOTES
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High Performance SWIR Imaging Cameras
Silicon based area detectors (e.g. CCDs or CMOS) are widely used in high-performance imaging applications, detecting wavelengths from soft x-ray through to near infrared (NIR). Typically, the quantum efficiency (QE) of these detectors decreases rapidly as the detection wavelength increases further into the NIR region. Above 1100 nm, Silicon is transparent and therefore cannot be used to directly detect photons of these wavelengths, however many other materials do have photon sensitivity at wavelengths of 1 µm and longer. The definition for each ‘sub-region’ within VIS-IR wavelength range is outlined in figure 1, along with some commonly used detector materials and their typical detection ranges. Each of the materials highlighted below present their own advantages and challenges and therefore prior to detector selection, the user must consider all aspects of the intended application, in addition to the wavelength response.
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