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APPLICATION NOTE: USI Universal Adaptive Profiling Measurement Mode for Superior Surface Texture Characterization (12/10/2020)

APPLICATION NOTE: USI Universal Adaptive Profiling Measurement Mode for Superior Surface Texture Characterization
Bruker has recently released the Universal Scanning Interferometry (USI) measurement mode to enable universal measurement results on wide-ranging surfaces for ContourX white light interferometry (WLI)
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Thursday, December 10, 2020
WHITE PAPERS & APPLICATION NOTES
USI Universal Adaptive Profiling Measurement Mode for Superior Surface Texture Characterization

Bruker has recently released the Universal Scanning Interferometry (USI) measurement mode to enable universal measurement results on wide-ranging surfaces for ContourX white light interferometry (WLI) profilometers. USI provides fully automated, self-sensing surface texture optimized signal processing while delivering the most accurate and realistic computation of the surface topography being analyzed.

 DOWNLOAD WHITE PAPER 
USI Universal Adaptive Profiling Measurement Mode for Superior Surface Texture Characterization

 

More White Papers from This Sponsor

- Advantages of Measuring Surface Roughness with White Light Interferometry
- Improving Additive Manufacturing with Accurate Surface Metrology
- High-Resolution Chemical Imaging with Tapping AFM-IR
 
Visit Photonics Media to download other white papers and learn more about the latest developments in lasers, imaging, optics, biophotonics, machine vision, spectroscopy, microscopy, photovoltaics and more.

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