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Simultaneous Intensity Profiling of Multiple Laser Beams Using the BladeCam-XHR Camera
There are several applications where the parallel processing of multiple beams can significantly decrease the overall time needed for the process. Intensity profile measurements that can characterize each of those beams can lead to improvements in that application. If each beam had to be characterized individually, the process would be very time consuming, especially for large numbers of beams. This white paper describes how the BladeCam-XHR can be used to simultaneously measure the intensity profile measurements for multiple beams by measuring the diffraction pattern from a diffraction grating and the intensity profile from a 3x3 fiber array focused using a 0.5 NA objective.
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Real-time Profiling for Focusing, M2, Divergence & Alignment
Beam intensity profiling is an essential tool in many aspects of photonics. The precise intensity distribution in a focused laser beam is critical in many applications: flow cytometry, laser printing, medical lasers, and cutting lasers are just a few examples. Intensity profile measurements can characterize and improve a product or process, leading to substantial cost and time savings that can pay for the measurement instrument many times over. This white paper describes how the unique, patented, real-time multiple z-plane XYZTF capabilities of the BeamMap2 slit-scan profiler can speed and simplify laser assembly alignment.
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